X-ray fluorescence technology provides one of the simplest, most accurate and most economic analytical methods for the determination of the elemental composition of most types of materials. The technique is generally non-destructive, requiring little if any sample preparation, and is suitable for solids, liquids, powders and alloys. XRF can measure a wide range of elements, from beryllium (5) to uranium (92), while providing sub-ppm detection limits for many applications.