Measurement of X-ray diffraction and scattering from materials

D/MAX RAPID II is arguably the most versatile micro-diffraction XRD system in the history of materials analysis. In production for well over a decade and continuously improved during that time period, the success of the D/MAX RAPID II is a testament to the suitability of imaging plate technology for measuring diffraction patterns and diffuse scattering from a wide range of materials.

Engineered for Versatility

It combines an exceptionally large active-area imaging plate that is sensitive to a wide range of radiation sources with the flexibility to mate it with a large variety of X-ray sources and optics. The nature of the imaging plate detector means that weak measurements can be made easily in the presence of strong measurements.

Low Cost of Ownership

Combining a well-proven, time-tested design with the lack of a need for calibration means that the RAPID II is a detector that can be maintained in the field with a minimum of downtime.

The Proof is in the Results

Experiments run on the RAPID II are limited only by the imagination of the researcher. Examples include, phase ID of powder samples, micro-diffraction mapping down to 10 microns, diffuse scattering, fiber diffraction, small molecule structure analysis, stress and texture measurements, etc.