Powder diffraction, thin film diffraction, SAXS, USAXS, in-plane scattering, pole figure, residual stress, non-ambient experiment

The SmartLab 3 is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and a five axis goniometer.

HyPix-400: Next generation 2-D detector

With the SmartLab 3, Rigaku introduces the HyPix-400, a semiconductor hybrid pixel array detector that was specifically designed for multipurpose X-ray diffractometers. Its large active area, high angular resolution and ultra-high dynamic range make it the perfect, affordable, 2-D detector solution for a large variety of applications, including powder and thin film diffraction.

5-axis goniometer gives additional information on thin film samples

This design enables the thin-film researcher to perform an “in-plane” scan, where the detector rotates in a plane parallel to the sample surface. This experimental configuration provides unique information for thin film materials; e.g., in-plane lattice constants and in-plane preferred orientation as a function of depth from the sample surface. If you are interested in thin film diffraction, this is a feature that will give you information that cannot be obtained on competitive diffractometers.

Maximize your uptime

Changing hardware configurations or consumables on some diffractometers is so daunting that people often invite their service engineer to perform the task. This can be costly and time consuming. The optics configuration on the SmartLab 3 is self-aligned. From the tube height to the monochromator alignment, all of the optics alignment is done automatically under computer control. This feature drastically reduces down time and cost of ownership of the instrument, and it allows you to be confident that your instrument will always be in aligned condition.